Introducing close-tolerance metrology system powered by MICRONITE predictive analytics

The main object of new-generation metrology control system is the question of fitness of measuring instruments, personnel, inspection methods, and machines to stringent requirements for zero-defect quality of close tolerance machining. Specifically, the ability to leave substantial portion of tolerance range for process variation and tool wear. The key parts of the unique metrology system are:

•    Flexible nonregular sampling design with no limitations on a number of testing elements
•    An array of special-purpose distributional  and non-distributional  statistical estimates
•    Interactive multi-variable analysis with clustering of testing elements
•    Decisions on permissible tolerance limits for individual metrology elements and their combinations
•    Direct connection to in-process and offline control models

Unique functionalities of Measurement Control System have been developed and put into practice

1.    Functionality determining acceptable accuracy and precision of measuring instruments
2.    Functionality determining acceptable accuracy, repeatability and reproducibility of inspection methods and observers
3.    Functionality supporting the development of efficient control plans
4.    Functionality supporting users in their efforts to assess/understand the effect of variables and cross-functional links on cumulative process capability
5.    Functionality allowing to bring together groups of root causes of variation and non-conformance in order to solve complex engineering problems

MICRONITE is attuned to what the user really wants to know about measuring and process capability. Search could take the user to certification of all measuring instruments or enterprise-wide listing of failures related to instruments or process capability.  Fundamentally, MICRONITE is oriented around people including operators, inspectors, and engineers. Task-defined  lay-out of data mining is a way to encourage people to find and solve quality problems.
The engineers are now focused on wide-ranging metrology problems, not just repeatability and reproducibility. Metrology information flow helps discover causes of unacceptable shifts, variation, and process capability. The system provides engineers with an unprecedented range of test design options, innovative data analysis and meaningful data interpretation tools. Every manufacturing company should develop a metrology project to create profound metrology knowledge using the MICRONITE methodology.


Framework of MICRONITE’s Metrology Analytics


Measurement errors defined and quantified by MICRONITE


Machine shops must view measurement data as a core asset in order to ensure that it is collected and managed in a way that makes it useful and credible. Data won’t improve quality unless management views its company’s inspection records and analytical tools as an important source of value. In order to gain an advantage through the assured reliability of measurement data, machine shops must be willing to look at what they are currently using for measurement assurance and be willing change their course based on metrology insight provided by MICRONITE.

From simple calculation of operator repeatability to computation of discrepancy between CMMs and high-precision modeling for acceptance of close-tolerance inspection,  MICRONITE meets both part-specific and enterprisewide metrology needs. You get proven and tested techniques you can depend on for accurate measurement results, now and in the future. New MICRONITE’s metrology tools include exact techniques for small data sets, task-focused acceptance criteria and easy-to-use methods for achieving   engineering solutions. The user can create a data set containing a mix of single elements that describe an actual inspection process. The observed and predicted values of measuring errors are used for quality problem solving and fine-tuning of control plans. In addition, limitations on automatic data capture (CMM and Vision Machines) can be determined and used for program optimization.

MICRONITE metrology applications

Certification. Certification protocol providing maximum certainty of measuring capability of instrument, appraiser, fixture, and inspection method
Discovery. Engineering study aimed at discovery of primary cause (s) of measurement errors and quantitative assessment of their contribution into overall measuring process capability Validation. Part-specific sampling designs for validation of assigned instruments and methods providing low-risk assessment of process capability
Acceptance. Product acceptance protocol providing assessment of measurement error and translating its value into acceptance sampling system for inspection by variables
Arbitration. Regulatory procedures for comparative assessment of accuracy and precision of measurement equipment belonging to producer and consumer


New-generation software assures successful solutions to metrology issues



Infinite designs of studies, error-proof assessment methods, and precise engineering solutions


One report that syncs measurement instruments, methods, and operators

With MICRONITE’s in-screen data analysis and the ability to generate the comprehensive metrology report, MICRONITE users are able to fully analyze statistical parameters and permissible measurement limits for key elements of the measurement system and their combinations. MICRONITE’s determination of the root cause of measurement errors and compilation of metrology dream-report takes minutes. The right measurement and timely measurement solution allow to make most of the data – from untainted quality data management to a competitive advantage.